Three-dimensional non-volatile memory device

ABSTRACT

A semiconductor device includes at least one first conductive layer stacked on a substrate where a cell region and a contact region are defined; at least one first slit passing through the first conductive layer, second conductive layers stacked on the first conductive layer; a second slit passing through the first and second conductive layers and connected with one side of the first slit, and a third slit passing through the first and second conductive layers and connected with the other side of the first slit.

CROSS-REFERENCE TO RELATED APPLICATION

The present application claims priority to Korean patent applicationnumber 10-2012-0130163 filed on Nov. 16, 2012, in the KoreanIntellectual Property Office, the entire disclosure of which isincorporated by reference herein.

BACKGROUND

1. Technical Field

Various embodiments relate generally to a semiconductor device and amethod of manufacturing the same and, more particularly, to athree-dimensional semiconductor device and a method of manufacturing thesame.

2. Related Art

A non-volatile memory retains data stored therein even when not powered.Two-dimensional memory devices in which memory cells are fabricated in asingle layer over a silicon substrate have reached physical limits inincreasing their degree of integration. Accordingly, three-dimensional(3D) non-volatile memory devices in which memory cells are stacked in avertical direction over a silicon substrate have been proposed.

A 3D non-volatile memory device includes interlayer insulating layersand conductive layers stacked alternately with each other and channellayers passing therethough. A lower selection transistor, memory cellsand an upper selection transistor are stacked along the channel layers.Therefore, the stacked conductive layers are to be patterned in order toselectively drive desired memory cells.

BRIEF SUMMARY

An embodiment relates to a semiconductor device capable of easilypatterning stacked conductive layers and a method of manufacturing thesame.

A semiconductor device according to an embodiment of the presentinvention includes at least one first conductive layer stacked on asubstrate where a cell region and a contact region are defined; at leastone first slit passing through the first conductive layer, secondconductive layers stacked on the first conductive layer; a second slitpassing through the first and second conductive layers and connectedwith one side of the first slit, and a third slit passing through thefirst and second conductive layers and connected with an other side ofthe first slit.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a layout view illustrating the structure of a semiconductordevice according to an embodiment of the present invention;

FIG. 1B is a cross-sectional view taken along line A-A′ of FIG. 1A;

FIG. 1C is a cross-sectional view taken along line B-B′ of FIG. 1A;

FIG. 2A is a cross-sectional view taken along line C-C′ of FIG. 1A,illustrating a semiconductor device according to first embodiments ofthe present invention;

FIG. 2B is a cross-sectional view of a semiconductor device according tosecond embodiments of the present invention;

FIG. 2C is a cross-sectional view of a semiconductor device according tothird embodiments of the present invention;

FIGS. 3A to 8C are layout views or cross-sectional views illustrating amethod of manufacturing a semiconductor device according to firstembodiments of the present invention;

FIGS. 9A to 9C are layout views illustrating the structure of asemiconductor device according to an embodiment of the presentinvention;

FIG. 10 is a block diagram illustrating the configuration of a memorysystem according to an embodiment of the present invention; and

FIG. 11 is a block diagram illustrating the configuration of a computingsystem according to an embodiment of the present invention

DETAILED DESCRIPTION

Hereinafter, various embodiments of the present invention will bedescribed with reference to the accompanying drawings. In the drawings,a thicknesses and a distance of components are exaggerated compared toan actual physical thickness and interval for convenience ofillustration. In the following description, detailed explanation ofknown related functions and constitutions may be omitted to avoidunnecessarily obscuring the subject manner of the present invention.Like reference numerals refer to like elements throughout thespecification and drawings.

FIG. 1A is a layout view illustrating the structure of a semiconductordevice according to an embodiment of the present invention. FIG. 1B is across-sectional view taken along line A-A′ of FIG. 1A. FIG. 1C is across-sectional view taken along line B-B′ of FIG. 1A.

As illustrated in FIGS. 1A to 1C, a semiconductor device according to anembodiment of the present invention may include a substrate (notillustrated), at least one first conductive layer 11, at least one firstslit SL1, second conductive layers 14, a second slit SL2 and third slitsSL3. A cell region CL and contact regions CT1 and CT2 may be defined inthe substrate. The first conductive layer 11 may be stacked on thesubstrate and formed in at least one level. The first slit SL1 may passthrough the first conductive layer 11. The second conductive layers 14may be stacked on the first conductive layer 11. The second slit SL2 maybe located in the cell region CL and connected with the first slit SL1through the first and second conductive layers 11 and 14. The thirdslits SL3 may be located in the contact regions CT1 and CT2 andconnected with the first slit SL1 through the first and secondconductive layers 11 and 14.

Each memory block MB may include the cell region CL and the contactregions CT1 and CT2 that are located at either or both sides of the cellregion CL. Memory cells may be formed in the cell region CL, and contactpads of word lines or selection lines stacked on top of one another maybe located in the contact regions CT1 and CT2. For example, the cellregion CL may be located between the contact regions CT1 and CT2.

The semiconductor device may further include a first insulating layer 13filled in the first slit SL1, a second insulating layer 16 filled in thesecond slit SL2 and interlayer insulating layers 12 and 15 interposedbetween the first conductive layer 11 and the second conductive layers14.

According to the above-described structure of the semiconductor device,the first conductive layer 11 may be divided into a plurality ofpatterns by the first to third slits SL1 to SL3. For example, the firstconductive layer 11 may be divided into a plurality of line patterns. Inaddition, each of the second conductive layer 14 at each level may beconnected through a region between the second and third slits SL2 andSL3.

For example, the semiconductor device may include vertically arrangedstrings. In this case, the first conductive layer 11 may be a lowerselection gate, at least one uppermost second conductive layer 14, amongthe second conductive layers 14, may be an upper selection gate, and theother second conductive layers may be control gates. A lower selectiongate on each layer may be patterned into a linear shape. On the otherhand, since the control gates and the upper selection gate on respectivelayers may not include the first slit SL1, the control gates and theupper selection gate may be in the shape of a plate including openingsformed by the second and third slits.

The semiconductor device may further include any one or a combination ofchannel layers CH, one or more fourth slits SL4, one or more fifth slitsSL5, one or more sixth slits SL6 and one or more seventh slits SL7. Thechannel layers CH may be located in the cell region CL and pass throughthe first and second conductive layers 11 and 14. The fourth slits SL4may be located between the channel layers CH. The fifth slits SL5 may belocated in the contact regions CT1 and CT2 and connected with the fourthslits SL4 through the first and second conductive layers 11 and 14. Thesixth slits SL6 may be located in the contact regions CT1 and CT2. Theseventh slits SL7 may be located at boundaries between neighboringmemory blocks MB and pass through the first and second conductive layers11 and 14.

According to the above-described structure of the memory device, thefirst and second conductive layers 11 and 14 may be divided into unitsof the memory blocks MB. The first conductive layer 11 may have linearshapes separated by the first to fifth slits SL1 to SL5. For example,the first conductive layer 11 of each of the memory blocks MB may befirst separated into two parts by the first to third slits SL1 to SL3and then separated again by the fourth and fifth slits SL4 and SL5,thereby forming four line patterns. In addition, each of the secondconductive layers 14 at each level may be connected through a regionother than the second, third, fourth and sixth slits SL2, SL3, SL4 andSL6.

Various changes may be made to positions and shapes of the first toseventh slits SL7. Various layouts of a semiconductor device accordingto an embodiment of the present invention may be described below withreference to FIGS. 9A to 9C.

FIG. 2A is a cross-sectional view taken along line C-C′ of FIG. 1A,illustrating a semiconductor device according to first embodiments ofthe present invention.

As illustrated in FIG. 2A, the semiconductor device according to thefirst embodiments of the present invention may include a substrate 20,an insulating layer 21 formed on the substrate 20, a first source layerS1 formed on the insulating layer 21, trenches T formed in the firstsource layer S1, second source layers S2 formed along inner surfaces ofthe trenches T and third source layers S3 formed in the second sourcelayers S2.

In addition, the semiconductor device may further include conductivelayers 23, the channel layers CH and memory layers M. The conductivelayers 23 may be stacked on the first source layer S1. The channellayers CH may pass through the conductive layers 23 and be coupled tothe second source layer S2. The memory layers M may surround outersurfaces of the channel layers CH and the second source layers S2.

The seventh slits SL7 may be deep enough to expose the first sourcelayer S1. The second slit SL2 may be located between neighboring secondsource layers S2 and be deep enough to expose the first source layer S1.The second slit SL2 may be filled with an insulating layers 25. Thefourth slits SL4 may be located between channel holes and deep enough topass through the trench T. In this case, lower portions of the fourthslits SL4 may be filled with the third source layers S3 while the restof the fourth slits SL4 are filled with the insulating layers 24.Therefore, the third source layer S3 may pass through the second sourcelayer S2 and the memory layer M and contact the first source layer S1.

Interlayer insulating layers 22 may be interposed between the stackedconductive layers 23. In addition, each of the channel layers CH mayhave a tubular structure with an open central portion, or a pillarstructure with a central portion completely filled. When each of thechannel layers CH has a tubular structure, an open central portion maybe filled with an insulating layer 26.

Each of the first and second source layers S1 and S2 may include a dopedpolysilicon layer, and the third source layer S3 may include a metallayer such as a tungsten layer. By forming a portion of the sourcelayers with a metal layer, source resistance may be reduced.

At least one lowermost conductive layer 23, among the conductive layers23, may be a lower selection gate LSG, at least one uppermost conductivelayer 23 may be an upper selection gate USG, and the remainingconductive layers 23 may be control gates CG. In this manner, stringsmay be vertically arranged to improve a degree of integration of thememory device.

The memory layer M may include all or part of a tunnel insulating layer,a charge storing layer and a charge blocking layer. Here, the chargestoring layer may include at least one of a floating gate such as apolysilicon layer, which can store charge, a trap layer such as anitride layer, which can trap charge, and nanodots. For reference, thememory layer M may include a phase-change material layer instead of thecharge storing layer.

In addition, though not illustrated in FIG. 2A, another memory layer maybe further included so that this memory layer may be interposed betweenthe memory layer M and the conductive layer 23 and surround top andbottom surfaces of the conductive layer 23. Here, the additional memorylayer may include all or part of a tunnel insulating layer, a chargestoring layer and a charge blocking layer. In addition, the chargeblocking layer of the additional memory layer may be a stacked layer ofan oxide layer and a material layer with a high dielectric constant.

FIG. 2B is a cross-sectional view of a semiconductor device according tosecond embodiments of the present invention. Hereinafter, a descriptionof the contents of the second embodiments of the same as those of thefirst embodiments is omitted.

As illustrated in FIG. 2B, the semiconductor device according to thesecond embodiments may include the substrate 20, the insulating layer 21formed on the substrate 20, a first conductive layer 27 formed on theinsulating layer 21, a buffer layer 28 formed on the first conductivelayer 27, the trenches T formed in the buffer layer 28, the first sourcelayers S1 formed along inner surfaces of the trenches T, the secondsource layers S2 formed in the first source layers S1, the secondconductive layers 23 stacked on the buffer layer 28, the channel layersCH passing through the second conductive layers 23 and coupled to thefirst source layer S1 and the memory layers M surrounding outer surfacesof the channel layers CH and the first source layer S1. Here, the bufferlayer 28 may include an insulating layer.

The fourth slits SL4 may be connected with the trench T. In thisexample, the first and second source layers S1 and S2 may be formed inthe trench T and may not contact the buffer layer 28. In anotherexample, the fourth slits SL4 may be deep enough to pass through thetrench T. In this case, the second source layer S2 may pass through thefirst source layer S1 and the memory layer M and contact the bufferlayer 28.

The second and seventh slits SL2 and SL7 may be deep enough to exposethe first conductive layer 27. The first conductive layer 27 mayfunction as an etch stop layer during an etch process performed to formthe second and seventh slits SL2 and SL7.

For reference, the first conductive layer 27 may be formed in aperipheral region (not illustrated) as well as in the cell region CL.The first conductive layer 27 formed in the peripheral region may be agate electrode of a transistor. For example, the insulating layer 21 andthe first conductive layer 27 may be sequentially formed on thesubstrate 20 including the cell region CL and the peripheral region.Subsequently, the first conductive layer 27 may be etched to form eighthslits SL8, and insulating layers 29 may be formed in the eighth slitsSL8. As a result, a gate electrode of a transistor may be located in theperipheral region, and the first conductive layer 27 located in the cellregion may be divided into units of the memory blocks MB. The seventhslit SL7 and the eighth slit SL8 may be located at a boundary betweenneighboring memory blocks MB and staggered with each other.

FIG. 2C is a cross-sectional view of a semiconductor device according tothird embodiments of the present invention. Hereinafter, a descriptionof the contents of the third embodiments of the same as those of thefirst and second embodiments is omitted.

As illustrated in FIG. 2C, the semiconductor device according to thethird embodiments of the present invention may include a source layer S,the conductive layers 23 stacked on the source layer S, the channellayers CH passing through the conductive layers 23 and coupled to thesource layer S, and the memory layers M surrounding outer surfaces ofthe channel layers CH.

Here, the source layer S may be formed by implanting impurities into thesubstrate 20 or include a separate conductive layer. In addition, thesecond, fourth and seventh slits SL2, SL4, and SL7 may be deep enough toexpose the source layer S.

FIGS. 3A to 8C are layout views or cross-sectional views illustrating amethod of manufacturing a semiconductor device according to the firstembodiments of the present invention. Here, the layout views illustratelayouts of the cross-sectional views at heights of I-I′ or II-II′, andthe cross-sectional views illustrate cross-sections taken along linesC-C′, D-D′ and E-E′ of the layout views.

As illustrated in FIGS. 3A and 3B, an insulating layer 31 may be formedon a substrate 30 in which the cell region CL and the contact regionsCT1 and CT2 are defined. Here, the insulating layer 31 may electricallyseparate the first source layer 32 from the substrate 30 and include anoxide layer.

Subsequently, a first source layer 32 may be formed on the insulatinglayer 31, and the first source layer 32 may be etched to form thetrenches T. Here, the first source layer 32 may be a polysilicon layerdoped with impurities. For example, the first source layer 32 may be apolysilicon layer doped with N type or P type impurities.

Each of the trenches T may define a region where the second source layerS2 and the third source layer S3 are formed during subsequent processes.The trenches T may be located in the cell region CL of each memory blockMB. Each of the trenches T may include an island pattern, a linepattern, or a combination thereof. In this embodiment, the trench T maybe shaped like a ladder including line trenches and island trenches thatcoupe the line trenches.

Subsequently, sacrificial layers 33 may be formed in the trenches T. Forexample, each of the sacrificial layers 33 may be a silicon nitridelayer (SiN) or a titanium nitride layer (TiN).

As illustrated in FIGS. 4A to 4C, at least one first material layer 35and second material layers 34 may be formed alternately with each otherover the first source layer 32. The first material layer 35 may beconfigured to form a conductive layer configured as a lower selectiongate. The second material layer 34 may separate the stacked conductivelayers from each other.

The first material layer 35 and the second material layer 34 may beformed of materials having a high etch selectivity therebetween. Forexample, the first material layer 35 may include a conductive layer suchas a polysilicon layer, and the second material layer 34 may include aninsulating layer such as an oxide layer. In another example, the firstmaterial layer 35 may include a conductive layer such as a dopedpolysilicon layer or a doped amorphous silicon layer. The secondmaterial layer 34 may include a sacrificial layer such as an undopedpolysilicon layer and an undoped amorphous silicon layer. In yet anotherexample, the first material layer 35 may include a sacrificial layersuch as a nitride layer, and the second material layer 34 may include aninsulating layer such as an oxide layer.

In this embodiment, a description will be made in reference to a case inwhich the first material layer 35 includes a sacrificial layer, and thesecond material layer 34 includes an insulating layer.

Subsequently, the first material layer 35 and the second material layers34 may be etched to form one or more first slits SL1 and one or morefifth slits SL5. The first and fifth slits SL1 and SL5 may be filledwith insulating layers 36. The first and fifth slits SL1 and SL5 may bedeep enough to expose the first source layer 32. In addition, the firstslit SL1 may be formed in the cell region CL or the contact regions CT1and CT2, and the fifth slits SL5 may be formed in the contact regionsCT1 and CT2.

As illustrated in FIGS. 5A to 5C, third material layers 37 and fourthmaterial layers 36 may be formed alternately with other over the firstand second material layers 35 and 34. Here, the third material layers 37may be formed of the same material as that of the first material layers35, and the fourth material layers 36 may be formed of the same materialas the third material layers 37.

Subsequently, the first to fourth material layers 34 to 37 may be etchedto form channel holes H so that the channel holes H may be connectedwith the trench T. The channel holes H may be tapered from top tobottom. The channel holes H may be arranged in a matrix format or astaggered pattern. For illustration purposes, four channel holes H aredepicted as located in the same cross-section. The number of channelholes H coupled to each trench T may vary depending on a degree ofintegration of the memory device.

Subsequently, the sacrificial layers 33 (see FIG. 4B) in the trench Tmay be removed through bottom surfaces of the channel holes H, andmemory layers 38 may be formed along inner surfaces of the trenches Tand the channel holes H. The memory layers 38 may be formed to storedata therein. Each of the memory layers 38 may include all or part of acharge blocking layer, a charge storing layer and a tunnel insulatinglayer.

Subsequently, a semiconductor layer 39 may be formed on the memory layer38. For example, the semiconductor layer 39 may include a polysiliconlayer dope with no impurities. Since widths of the channel holes H arereduced from top to bottom, connecting portions of the trench T and thechannel holes H may be completely sealed before the trench T iscompletely filled with the semiconductor layer 39. Therefore, emptyspace may be formed in the trench T. In addition, the channel holes Hmay not be completely filled with the semiconductor layer 39, butcentral portions thereof may remain empty. In this case, an insulatinglayer 40 may be formed substantially in the central portion of thesemiconductor layer 39.

Subsequently, the fourth slits SL4 may be formed through each of thetrenches T. For example, the first to fourth material layers 34 to 37,the memory layer 38 and the semiconductor layer 39 may be etched, andthe first source layer 32 may be subsequently etched to a predetermineddepth, so that the fourth slits SL4 may be formed. Each of the fourthslits SL4 may be located substantially at the center of the trench T,and an end of the fourth slits SL4 may be widened to substantially forman I-shape.

For reference, the sixth slits SL6 may be formed at the same time orsubstantially the same time as the fourth slits SL4 are formed. Thesixth slits SL6 may be located in the contact regions CT1 and CT2 ofeach memory block MB. For example, each of the sixth slits SL6 maysubstantially have a linear shape extending in one direction, a linearshape having at least one protruding portion, or a “U” shape. Inaddition, when the first source layer 32 includes an insulating layer,the fourth slit SL4 may be deep enough to be coupled to the trench T(refer to second embodiment).

Subsequently, the semiconductor layer 39 in the trench T may be dopedwith impurities through the fourth slit SL4 to form a second sourcelayer 39B. For example, the second source layer 39B may be formed bydoping the semiconductor layer 39 in the trench T with N type or P typeimpurities by performing a plasma doping process. In another example,the second source layer 39B may be formed by forming an oxide layerdoped with impurities on the semiconductor layer 39 and diffusing theimpurities, included in the oxide layer, into the semiconductor layer 39by thermal treatment, and the oxide layer may be subsequently removed.In this manner, a horizontal region of the semiconductor layer 39 formedin the trench may be the second source layer 39B, and a vertical regionof the semiconductor layer 39 passing through the stacked layers may bea channel layer 39A.

As illustrated in FIGS. 6A to 6C, a third source layer 41 may be formedin the second source layer 39B and a lower portion of the fourth slitSL4. For example, a barrier layer may be formed along an inner surfaceof the trench T, in which the second source layer 39B is formed, and aninner surface of the fourth slit SL4, and a metal layer may besubsequently formed. Subsequently, the barrier layer and the metal layerformed in regions other than those in the first and second source layers32 and 39B may be removed to form the third source layer 41. The barrierlayer may be any one or a combination of a titanium layer (Ti) and atitanium nitride layer (TiN). The metal layer may include a tungstenlayer (W). In addition, when the barrier layer and the metal layer areetched, if the tungsten layer formed in the lower portion of the fourthslit SL4 is disconnected from the tungsten layer formed in the secondsource layer 39B, the disconnected tungsten layers may be connectedtogether again by growing the tungsten layer by using a selective growthprocess.

Subsequently, an insulating layer 42 may be formed in the fourth slitSL4. Here, the sixth slits SL6 may also be filled with the insulatinglayer 42. Here, the insulating layer 42 may be an oxide layer formedusing High Temperature Oxidation (HTO) or High Density Plasma (HDP), oran oxide layer such as an Spin On Dielectric (SOD) layer or apolysilazane (PSZ) layer.

For reference, though illustrated in FIGS. 6A to 6C, before the fourthslit SL4 is formed, the contact regions CT1 and CT2 may be patternedstepwise by etching the first to fourth material layers 34 to 37. Forexample, the contact regions CT1 and CT2 may be patterned stepwise suchthat at least one pair of the first and second material layers 35 and 34or at least one pair of the third and fourth material layers 37 and 36may form a single tier. Subsequently, an insulating layer 45 (see FIG.8C) may be formed over the entire stepwise-patterned resultant.

The time when the contact regions CT1 and CT2 are patterned stepwise maychange according to the order in which the fourth and sixth slits SL4and SL6 are formed. For example, when the fourth slit SL4 and the sixthslit SL6 are formed at the same time, the contact regions CT1 and CT2may be patterned stepwise before the fourth and sixth slits SL4 and SL6are formed. In another example, when the sixth slit SL6 is formed afterthe fourth slit SL4 is formed, the contact regions CT1 and CT2 may bepatterned stepwise before the sixth slit SL6 is formed.

As illustrated in FIGS. 7A to 7C, the first to fourth material layers 34to 37 may be etched to form the second slit SL2 and the third slit SL3.The second slit SL2 may be located in the cell region CL and connectedwith the first slit SL1. The third slit SL3 may be located in thecontact regions CT1 and CT2 and connected with the first slit SL1. Thesecond and third slits SL2 and SL3 may pass through the first to fourthmaterial layers 34 to 37 and connected with the first slit SL1.

For reference, when the second and third slits SL2 and SL3 are formed,at least one seventh slit SL7 may be further formed so that the seventhslit SL7 may be located at a boundary between neighboring memory blocksMB. Here, the seventh slit SL7 may be deep enough to pass through thefirst to fourth material layers 34 to 37.

Subsequently, the first and third material layers 35 and 37 exposedthrough the second, third and seventh slits SL2, SL3 and SL7 may beetched to form first recessed regions. Since the first and thirdmaterial layers 35 and 37 are etched with the first, fourth and fifthslits SL1, SL4 and SL5 filled with the insulating layers 36 and 42, theremaining second and fourth material layers 34 and 36 may be preventedfrom tilting to one side or collapsing.

Subsequently, conductive layers 43 may be formed in the first recessedregions. For reference, memory layers including charge blocking layersmay be further formed in the first recessed regions before theconductive layers 43 are formed.

Subsequently, insulating layers 44 may be formed in the second, thirdand seventh slits SL2, SL3 and SL7. At this time, an air gap may beformed in the second, third and seventh slits SL2, SL3 and SL7 bycontrolling deposition conditions.

As illustrated in FIGS. 8A to 8C, first to third contact plugs CP1 toCP3 may be formed such that the first to third contact plugs CP1 to CP3may be coupled to the conductive layers 43. In addition, a fourthcontact plug CP4 may be formed such that the fourth contact plug CP4 maybe coupled to the third source layer 41 through the fourth slit SL4.

The first contact plug CP1 may pass through the insulating layers 45 and36 and be coupled to the conductive layer 43 configured as a lowerselection gate. The second contact plugs CP2 may pass through theinsulating layers 45 and 36 and be coupled to the conductive layer 43configured as a control gate. The third contact plug CP3 may passthrough the insulating layers 45 and 36 and be coupled to the conductivelayer 43 configured as an upper selection gate. In addition, the secondcontact plugs CP2 may be formed between the sixth slits SL6. The shapesand positions of the sixth slits SL6 may determine positions where thesecond contact plugs CP2 are formed.

As a result, the semiconductor device including the first to thirdsource layers 32, 39B and 41 may be manufactured. According to theabove-described processes, the first and fifth slits SL1 and SL5 may beformed first, then the fourth and sixth slits SL4 and SL6 and finallythe second, third and seventh slits SL2, SL3 and SL7. Therefore, thefirst material layer 35 configured as a lower selection gate may bepatterned into a linear shape by using a self-aligned process. Inaddition, since the third material layers 37 configured as a controlgate and an upper selection gate do not include the first and fifthslits SL1 and SL5, the third material layers 37 may be formed ascontinuous layers. In other words, by using a self-aligned process, thestacked layers may be formed into various patterns.

The above-described manufacturing processes may be partly changedaccording to types of the first to fourth material layers 34 to 37.

For example, the first and third material layers 35 and 37 may includeconductive layers, and the second and fourth material layers 34 and 36may include interlayer insulating layers. In this example, after thesecond, third and seventh slits SL2, SL3 and SL7 are formed, a processof siliciding the exposed first and third material layers 35 and 37 maybe further performed. Processes of forming first recessed regions may beomitted.

In another example, the first and third material layers 35 and 37 mayinclude conductive layers, and the second and fourth material layers 34and 36 may include sacrificial layers. In this case, instead of formingfirst recessed regions, the second and fourth material layers 34 and 36exposed through the second, third and seventh slits SL2, SL3 and SL7 maybe etched to form second recessed regions. Subsequently, the secondrecessed regions and the second, third and seventh slits SL2, SL3 andSL7 may be filled with the insulating layers 44. As described above,after these slits are formed, a process of siliciding the first andthird material layers 35 and 37 exposed through the slits may be furtherperformed.

For reference, a method of manufacturing the semiconductor deviceaccording to the first embodiments has been described in thespecification. However, by applying this manufacturing method, thesemiconductor devices according to the second and third embodiments ofthe present invention may be manufactured. The semiconductor deviceaccording to the second embodiments may be manufactured by controllingdepths at which the fourth slits SL4 are formed. In addition, thesemiconductor device according to the third embodiments may bemanufactured by omitting the processes of forming the trenches T, thesacrificial layer 33, the fourth slits SL4 and the second and thirdsource layers 39B and 41. When the semiconductor device according to thethird embodiments are manufactured, the fourth slits SL4 may be furtherformed when the sixth slits SL6 are formed, and the insulating layers 42may be formed in the fourth slits SL4. In this case, the fourth slitsSL4 may have substantially the same depth as the sixth slits SL6.

FIG. 9A is a layout view illustrating the structure of a semiconductordevice according to an embodiment of the present invention. Hereinafter,a description of the contents of this embodiment the same as those ofthe first, second and third embodiments is omitted.

As illustrated in FIG. 9A, the semiconductor device according to theseembodiments of the present invention may include silicide layers SCformed by siliciding the conductive layers 43 around the fourth andsixth slits SL4 and SL6 by a predetermined thickness.

For example, when the first and third material layers 35 and 37 includeconductive layers such as polysilicon layers, and the second and fourthmaterial layers 34 and 36 include insulating layers such as oxidelayers, the first and third material layers 35 and 37 exposed throughthe slits SL1 to SL7 may be silicided to form the silicide layers SC.

In these embodiments, a description has been in reference to a case inwhich the exposed first and third material layers 35 and 37 may besilicided after the fourth and sixth slits SL4 and SL6 are formed.Alternatively, a siliciding process may be performed after the first andfifth slits SL1 and SL5 are formed or after the second, third andseventh slits SL2, SL3 and SL7 are formed.

FIG. 9B is a layout view illustrating the structure of a semiconductordevice according to an embodiment of the present invention. Hereinafter,a description of the contents of these embodiments the same as theprevious embodiments is omitted.

As illustrated in FIG. 9B, the semiconductor device according to theseembodiments of the present invention may include the seventh slit SL7formed around the memory block MB. For example, the seventh slit SL7 mayhave a substantially square shape. In this case, the seventh slit SL7may be connected with the third and fifth slits SL3 and SL5. Therefore,a lower selection gate may be first separated by the first to third andseventh slits SL1, SL3, and SL7 and then further separated by the fourthand fifth slits SL4 and SL5, thereby forming four line patterns.

FIG. 9C is a layout view illustrating the structure of a semiconductordevice according to an embodiment of the present invention. Hereinafter,a description of the contents of these embodiments the same as those ofthe previous embodiments is omitted.

As illustrated in FIG. 9C, the semiconductor device according to theseembodiments of the present invention may include the sixth slits SL6having various lengths (not shown). In addition, the third slits SL3 andsecond slits SL2 may be arranged in a line or a staggered configuration.When the third slit SL3 and the second slit SL2 are staggered with eachother according to this embodiment, the first slit SL1 may be bent suchthat the second slit SL2 and the third slit SL3 are connected with eachother. For reference, the second slit SL2 and the third slit SL3 may beconnected with each other by increasing the width of the first slit SL1

FIG. 10 is a view illustrating the configuration of a memory systemaccording to an embodiment of the present invention.

As illustrated in FIG. 10, a memory system 100 according to anembodiment of the present invention may include a non-volatile memorydevice 120 and a memory controller 110.

The non-volatile memory device 120 may have a structure according to thelayout as described above. In addition, the non-volatile memory device120 may be a multi-chip package composed of a plurality of flash memorychips.

The memory controller 110 may be configured to control the non-volatilememory device 120. The memory controller 110 may include SRAM 111, a CPU112, a host interface 113, an ECC 114 and a memory interface 115. TheSRAM 111 may function as an operation memory of the CPU 112. The CPU 112may perform the general control operation for data exchange of thememory controller 110. The host interface 113 may include a dataexchange protocol of a host being coupled to the memory system 100. Inaddition, the ECC 114 may detect and correct errors included in a dataread from the non-volatile memory device 120. The memory interface 115may interface with the non-volatile memory device 120. The memorycontroller 110 may further include ROM that stores code data tointerface with the host.

The memory system 100 having the above-described configuration may be asolid state disk (SSD) or a memory card in which the memory device 120and the memory controller 110 are combined. For example, when the memorysystem 100 is an SSD, the memory controller 110 may communicate with theoutside (e.g., a host) through one of the interface protocols includingUSB, MMC, PCI-E, SATA, PATA, SCSI, ESDI and IDE.

FIG. 11 is a block diagram illustrating the configuration of a computingsystem according to an embodiment of the present invention.

As illustrated in FIG. 11, a computing system 200 according to anembodiment of the present invention may include a CPU 220, RAM 230, auser interface 240, a modem 250 and a memory system 210 that areelectrically coupled to a system bus 260. In addition, when thecomputing system 200 is a mobile device, a battery may be furtherincluded to apply operating voltage to the computing system 200. Thecomputing system 200 may further include application chipsets, a CameraImage Processor (CIS) and mobile DRAM.

As described above with reference to FIG. 10, the memory system 210 mayinclude a non-volatile memory 212 and a memory controller 211. As such,the non-volatile memory device 212 may have a structure according to thelayout as described above.

According to an embodiment of the present invention, first and secondconductive layers stacked on top of one another may be patterned byusing a self-aligned process.

What is claimed is:
 1. A semiconductor device, comprising: at least onefirst conductive layer stacked in a stacking direction on a substratewhere a cell region and a contact region are defined; at least one firstslit passing through the first conductive layer in the stackingdirection; a plurality of second conductive layers stacked in thestacking direction on the first conductive layer; first and secondchannel layers each passing through the first and second conductivelayers in the stacking direction; a second slit passing through thefirst and second conductive layers in the stacking direction, connectedwith one side of the first slit and located between the first and secondchannel layers; and a third slit passing through the first and secondconductive layers in the stacking direction and connected with an otherside of the first slit, wherein each of the second conductive layers isconnected between the second and third slits and over the first slit. 2.The semiconductor device of claim 1, wherein the second slit is locatedin the cell region, and the third slit is located in the contact region.3. The semiconductor device of claim 1, wherein the first conductivelayer is divided into a plurality of patterns by the first to thirdslits.
 4. The semiconductor device of claim 1, wherein each of thesecond conductive layers has a shape of a plate including openingsformed by the second and third slits.
 5. The semiconductor device ofclaim 1, further comprising: a first source layer formed under the firstconductive layer; a trench formed in the first source layer; a secondsource layer formed in the trench and coupled to the channel layers; afourth slit located between the channel layers and passing through thetrench; and a third source layer formed in the second source layer and alower portion of the fourth slit, wherein the third source layer passesthrough the second source layer and is coupled to the first sourcelayer.
 6. The semiconductor device of claim 1, further comprising: aninsulating layer formed under the first conductive layer; a trenchformed in the insulating layer; a first source layer formed in thetrench and coupled to the channel layers; a second source layer formedin the first source layer; and a fourth slit located between the channellayers and coupled to the trench.
 7. The semiconductor device of claim5, further comprising fifth slits passing through the first conductivelayer and coupled to the fourth slit, wherein the fifth slits arelocated in the contact region.
 8. The semiconductor device of claim 7,wherein the first conductive layer is divided by the first to fifthslits into a plurality of patterns.
 9. The semiconductor device of claim7, wherein each of the second conductive layers has a shape of a plateincluding openings formed by the second to fourth slits.
 10. Thesemiconductor device of claim 7, further comprising sixth slits crossingthe fifth slits and passing through the first and second conductivelayers.
 11. The semiconductor device of claim 10, wherein the sixthslits have various lengths.
 12. The semiconductor device of claim 10,wherein the sixth slits are located in the contact regions.
 13. Thesemiconductor device of claim 10, wherein the sixth slits substantiallyhave a linear shape extending in one direction, a linear shape having atleast one protruding portion, or a “U” shape.
 14. The semiconductordevice of claim 6, wherein the fourth slit is located substantially atthe center of the trench.
 15. The semiconductor device of claim 6,wherein ends of the fourth slit are widened substantially forming anI-shape.
 16. The semiconductor device of claim 1, further comprisingseventh slits located at a boundary between neighboring memory blocksand passing through the first and second conductive layers.
 17. Thesemiconductor device of claim 16, wherein each of the seventh slits isformed around each of the memory blocks and connected with the thirdslit.
 18. The semiconductor device of claim 1, wherein the firstconductive layer is a lower selection gate; at least one uppermostsecond conductive layer, among the second conductive layers, is an upperselection gate; and remaining second conductive layers are controlgates.
 19. The semiconductor device of claim 1, wherein the second slitand the third slit are arranged in a line or a staggered configuration.20. The semiconductor device of claim 1, wherein the first slit has abent linear shape.